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Title: Dup instruction defines array test specimens
Post by: stevenxie on December 01, 2020, 11:26:34 PM

hi，everyone.
this is a dup instruction defines array test speciens.

include \masm32\include64\masm64rt.inc ;加载MASM64 SDK主预处理器包含

.data
val00 qword 3 dup(54*24)
val01 BYTE 20 DUP ( 65 ) ;20 个字节，值都为 0
val02 BYTE 20 DUP ( ? ) ;20 个字节，非初始化
str01 BYTE 4 DUP ( "STACK" ),0 ; 23 个字节
str02 BYTE 4 DUP ( "STACK",0) ; 20 个字节
str03 BYTE 4 DUP ( "STACK",32 ),0 ; 23 个字节
counter byte 0 ;作为循环条件计数器

.code
entry_point proc
;*******************循环体*********************************
lb1: ;循环体开始首标签
cmp counter,3 ;循环条件计数器counter与数组val00的dup整数计数器值3进行条件比较
je lb2 ;判断如果counter值等于dup整数计数器值3，则无条件转移至下一个标签lb2,跳出循环体
mov rax,qword ptr val00 ;将数组内存地址及偏移量推送入中央处理器64位易失性寄存器rax中
conout tab,str$(rax),tab ;调用控制台显示功能宏conout，屏幕依次显示数组val00内的各数组元素值
mov rax,[qword ptr val00]+8 ;数组元素指针增加8字节，指向下一个数组元素内存地址
add counter,1 ;循环条件计数器counter值自动加一
jmp lb1 ;只要循环判断条件成立，无条件转移至首标签lb1,继续执行循环体
;*******************循环体*********************************
lb2:
conout lf
conout tab,tab, "&"
conout lf
conout tab,tab
stdout addr val01 ;注意显示的结果
conout lf
conout tab,tab,"*"
conout lf
conout tab,tab
stdout addr str01 ;注意显示的结果
conout lf
conout tab,tab
stdout addr str02 ;注意显示的结果
conout lf
conout tab,tab
stdout addr str03 ;注意显示的结果

conout lf,tab,tab
waitkey

.exit

entry_point endp
end

Title: Re: Dup instruction defines array test specimens
Post by: hutch-- on December 02, 2020, 12:44:31 AM

This looks like it works OK. I can read the comments but the basic logic is sound.

Title: Re: Dup instruction defines array test specimens
Post by: jj2007 on December 02, 2020, 02:29:35 AM

Finally a well-commented source :thumbsup:

Title: Re: Dup instruction defines array test specimens
Post by: LordAdef on December 13, 2020, 10:34:39 AM

Your second comment seems a bit ambiguos :skrewy: :skrewy: :skrewy:

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